Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, October 1 to December 31, 1972 (Classic Reprint) - Couverture souple
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The digital edition of all books may be viewed on our website before purchase. Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, October 1 to December 31, 1972 (Classic Reprint)
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This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works. This text has been digitally restored from a historical edition. Some errors may persist, however we consider it worth publishing due to the work's historical value.The digital edition of all books may be viewed on our website before purchase.
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Methods of Measurement for Semiconductor Materials, Process Control, and
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Paperback. Etat : New. Print on Demand. This book presents a detailed study of how defects in semiconductor materials and devices affect the performance, interchangeability, and reliability of discrete semiconductor devices and integrated circuits. The author explores established measurement methods while seeking to improve existing techniques and create new ones for the more reliable detection of defects that may lead to device failure. By focusing on the electrical properties of bulk silicon wafers, and the characterization of generation-recombination-trapping centers in silicon, the text provides valuable insights into controlling device fabrication. The author also examines gold-doped silicon and the use of infrared methods for detecting and counting impurity and defect centers in semiconductors, offering a comprehensive study from materials to methods. This book is an essential resource for professionals and researchers in the semiconductor industry, providing a deeper understanding of the factors influencing device performance and the techniques used to ensure reliability. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. N° de réf. du vendeur 9780365536581_0
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices
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PAP. Etat : New. New Book. Shipped from UK. Established seller since 2000. N° de réf. du vendeur LW-9780365536581
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices
Vendeur : PBShop.store UK, Fairford, GLOS, Royaume-Uni
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PAP. Etat : New. New Book. Shipped from UK. Established seller since 2000. N° de réf. du vendeur LW-9780365536581
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