National Security and Technology Transfer: The Strategic Dimensions of East-west Trade - Couverture rigide

 
9780367014872: National Security and Technology Transfer: The Strategic Dimensions of East-west Trade

Synopsis

The deterioration of détente in the wake of the ongoing Soviet arms build-up has sharply focused the East-West trade debate on the question of advanced technology transfer from the United States and its allies to the Soviet bloc. The transfer and acquisition of high technology have become central ingredients in super-power relations and are key elements of any national security policy. President Reagan, among others, has questioned the wisdom of the policies of the 1960s and early 1970s, when trade with the Soviet Union and Eastern Europe expanded rapidly. At recent industrial nation summits, conferees of Western countries agreed to high-level review of their East-West technology trade policies. But in light of the apparent West European commitment to continue and expand trade with the East, as exemplified by the Siberian gas pipeline project, and the growing U.S. opposition to such technology transfer, divisions between U.S. and Western trade policies toward the East are likely to become increasingly acute in the years ahead. Professors Bertsch and McIntyre have selected comprehensive and representative articles to examine the question of technology transfer from a variety of perspectives--political, economic, and military-- emphasizing both the U.S. and the Western allies' points of view and offering insights into the complex issues raised by the strategic dimensions of East-West trade.

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À propos de l?auteur

Dr. Bertsch is professor of political science at the University of Georgia. Dr. Mcintyre is assistant professor in the Technology and Science Policy Program at the Georgia Institute of Technology and a fellow of the Dean Rusk Center at the University of Georgia Law School

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Autres éditions populaires du même titre

9780367164744: National Security And Technology Transfer

Edition présentée

ISBN 10 :  0367164744 ISBN 13 :  9780367164744
Editeur : Routledge, 2020
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