Articles liés à Advanced VLSI Design and Testability Issues
Synopsis
This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
À propos de l?auteur
Suman Lata Tripathi is associated with Lovely Professional University, Phagwara, Punjab, as Professor with more than seventeen years of experience in academics. Her area of expertise includes microelectronics device modeling and characterization, low power VLSI circuit design, VLSI design of testing and advance FET design for IOT and biomedical applications etc.
Sobhit Saxena is an Associate Professor at Lovely Professional University University, Phagwara, Punjab. His area of expertise includes nanomaterial synthesis and characterization, electrochemical analysis and modeling and simulation of CNT based interconnects for VLSI circuits.S. K. Mohapatra is working as Assistant Professor, in School of Electronics Engineering, Kalinga Institute of Industrial Technology, Bhubaneswar. His research interests include Modeling and Simulation of Nanoscale Devices and its application in IoT. Energy efficient Wireless Sensor Networking, Adhoc Networks, Cellular Communications, Metamaterial absorbers in THz application, UWB-MIMO Antenna, Reconfigurable Antenna, Performance enhancement for high frequency.
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Advanced VLSI Design and Testability Issues
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Kartoniert / Broschiert. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Suman Lata Tripathi is associated with Lovely Professional University, Phagwara, Punjab, as Professor with more than seventeen years of experience in academics. Her area of expertise includes microelectronics device modeling and characterization, low pow. N° de réf. du vendeur 525033856
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Advanced VLSI Design and Testability Issues
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Taylor & Francis Ltd, 2022
ISBN 10 : 0367538369
ISBN 13 : 9780367538361
Neuf
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Advanced VLSI Design and Testability Issues
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Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This bookfacilitates the VLSI-interestedindividuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, includingimage processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored, as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high-performance integrated circuits (ICs) including low power devices and new emerging materials, which can play a very important role in achieving new functionalities, are the most interesting part of the book. The testing of VLSI circuits becomes more crucial than the designing of the circuits in this nanometer technology era. The role of fault simulation algorithms is very well explained, and its implementation using Verilog is the key aspect of this book. This book is well organized into 20 chapters. Chapter 1 emphasizes on uses of FPGA on various image processing and biomedical applications. Then, the descriptions enlighten the basic understanding of digital design from the perspective of HDL in Chapters 2-5. The performance enhancement with alternate material or geometry for silicon-based FET designs is focused in Chapters 6 and 7. Chapters 8 and 9 describe the study of bimolecular interactions with biosensing FETs. Chapters 10-13 deal with advanced FET structures available in various shapes, materials such as nanowire, HFET, and their comparison in terms of device performance metrics calculation. Chapters 14-18 describe different application-specific VLSI design techniques and challenges for analog and digital circuit designs. Chapter 19 explains the VLSI testability issues with the description of simulation and its categorization into logic and fault simulation for test pattern generation using Verilog HDL. Chapter 20 deals with a secured VLSI design with hardware obfuscation by hiding the IC's structure and function, which makes it much more difficult to reverse engineer. 380 pp. Englisch. N° de réf. du vendeur 9780367538361
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Advanced VLSI Design and Testability Issues
Edité par
Taylor & Francis Group, 2022
ISBN 10 : 0367538369
ISBN 13 : 9780367538361
Neuf
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Advanced VLSI Design and Testability Issues
Edité par
Taylor & Francis Group, 2022
ISBN 10 : 0367538369
ISBN 13 : 9780367538361
Neuf
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