Articles liés à Data Mining And Diagnosing Ic Fails
Synopsis
There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statistics and data mining handbooks. Moreover, many data mining techniques from other data analysis environments are appropriate for analyzing IC fails, but have not yet been employed for that purpose. Data Mining and Diagnosing IC Fails brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences. The various approaches discussed in this book have a thorough theoretical underpinning, but are geared towards applications on real life fail data and state of the art ICs. The description techniques and analysis routines are sufficiently detailed that professional manufacturing engineers can implement them in their own work environment.
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- ÉditeurSpringer-Verlag New York Inc.
- Date d'édition2005
- ISBN 10 0387249931
- ISBN 13 9780387249933
- ReliureRelié
- Langueanglais
- Nombre de pages250
- Coordonnées du fabricantnon disponible
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Data Mining and Diagnosing IC Fails.
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New York/ NY, Springer US., 2005
ISBN 10 : 0387249931
ISBN 13 : 9780387249933
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2005. 16 x 24 cm. XX, 250 S. XX, 250 p. 46 illus. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. (Frontiers in Electronic Testing). Sprache: Englisch. N° de réf. du vendeur 214ZB
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Data Mining And Diagnosing Ic Fails
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Data Mining and Diagnosing IC Fails
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Etat : New. pp. 272. N° de réf. du vendeur 18239719
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Data Mining and Diagnosing IC Fails
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Data Mining and Diagnosing IC Fails
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Data Mining And Diagnosing Ic Fails
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Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing, 31)
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Springer, 2005
ISBN 10 : 0387249931
ISBN 13 : 9780387249933
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Data Mining And Diagnosing Ic Fails
Vendeur : Romtrade Corp., STERLING HEIGHTS, MI, Etats-Unis
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Etat : New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide. N° de réf. du vendeur ABNR-84479
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Data Mining And Diagnosing Ic Fails
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Data Mining and Diagnosing IC Fails
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Springer US Jun 2005, 2005
ISBN 10 : 0387249931
ISBN 13 : 9780387249933
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Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statistics and data mining handbooks. Moreover, many data mining techniques that are standard in other data analysis environments, and that are appropriate for analyzing IC fails, have not yet been employed for that purpose. Data Mining and Diagnosing IC Fails addresses the problem of obtaining maximum information from (functional) integrated circuit fail data about the defects that caused the fails. It starts at the highest level from mere sort codes, and drills down via various data mining techniques to detailed logic diagnosis. The various approaches discussed in this book have a thorough theoretical underpinning, but are geared towards applications on real life fail data and state of the art ICs. This book brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences. The purpose of the book is to bring together in one place a large number of analysis, data mining and diagnosis techniques that have proven to be useful in analyzing IC fails. The descriptions of the techniques and analysis routines is sufficiently detailed that professional manufacturing engineers can implement them in their own work environment. 272 pp. Englisch. N° de réf. du vendeur 9780387249933
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