Fault Diagnosis of Analog Integrated Circuits - Couverture rigide

Kabisatpathy, Prithviraj; Barua, Alok; Sinha, Satyabroto

Couverture rigide

ISBN 10 : 038725742X ISBN 13 : 9780387257426

Editeur : Springer-Verlag New York Inc., 2005

Synopsis

Fault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. The objective of this book is to study the testing and fault diagnosis of analog and analog part of mixed signal circuits. A background in analog integrated circuit, artificial neural network is desirable but not essential. The text covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits. Fault model of the devices in analog domain has been introduced in the text. The test stimulus generations are also discussed in details. Experimental verification of some state of the art techniques has also been presented in the book. It also contains problems that can be used as quiz or homework. This book enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.

A propos du livre

Présentation de l'éditeur

Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipol

Détails de l'édition

• Éditeur: Springer-Verlag New York Inc.
• Date d'édition: 2005
• Langue: anglais
• ISBN 10: 038725742X
• ISBN 13: 9780387257426
• Reliure: Relié
• Nombre de pages: 182
• Coordonnées du fabricant: non disponible
• Personne responsable: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Allemagne