Articles liés à Scanning Probe Microscopy: Electrical And Electromechanical...

Scanning Probe Microscopy: Electrical And Electromechanical Phenomena at the Nanoscale - Couverture rigide

Kalinin, Sergei V.; Gruverman, Alexei

 
9780387286679: Scanning Probe Microscopy: Electrical And Electromechanical Phenomena at the Nanoscale
Couverture rigide
ISBN 10 : 0387286675 ISBN 13 : 9780387286679
Editeur : Springer-Verlag New York Inc., 2006

Synopsis

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Éditeur
Springer-Verlag New York Inc.
Date d'édition
2006
Langue
anglais
ISBN 10 
0387286675
ISBN 13 
9780387286679
Reliure
Relié
Nombre de pages
1018
Coordonnées du fabricant
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