Defect-Oriented Testing for Nano-Metric Cmos Vlsi Circuits - Couverture rigide

Sachdev, Manoj; Pineda De Gyvez, José

 
9780387465463: Defect-Oriented Testing for Nano-Metric Cmos Vlsi Circuits
Couverture rigide
ISBN 10 : 0387465464 ISBN 13 : 9780387465463
Editeur : Springer-Verlag New York Inc., 2007

Synopsis

This book is essential to understand new test methodologies, algorithms and industrial practices. Without its insight into the physics of nano-metric technologies, it would be difficult to develop system-level test strategies that yield a high IC fault coverage. The work on defect-oriented testing presented in the book is not final, and it is an evolving field with interesting challenges imposed by the ever-changing nature of nano-metric technologies. The 2nd edition of Defect Oriented Testing has been extensively updated with the addition of chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering to provide a link between defect sources and yield. Test and design practitioners from academia and industry will find that Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits lays the foundations for further pioneering work.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Éditeur
Springer-Verlag New York Inc.
Date d'édition
2007
Langue
anglais
ISBN 10 
0387465464
ISBN 13 
9780387465463
Reliure
Relié
Numéro d'édition
2
Nombre de pages
328
Coordonnées du fabricant
non disponible
Personne responsable
CMN Printpool Inh. Mathis Neumann
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Autres éditions populaires du même titre

9781441942852: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Edition présentée

ISBN 10 :  1441942858 ISBN 13 :  9781441942852
Editeur : Springer, 2010
Couverture souple