Statistical Methods for SPC and TQM - Couverture rigide

Bissell, D

Couverture rigide

ISBN 10 : 0412394405 ISBN 13 : 9780412394409

Editeur : Chapman and Hall/CRC, 1994

Synopsis

Statistical Methods for SPC and TQM sets out to fill the gap for those in statistical process control (SPC) and total quality management (TQM) who need a practical guide to the logical basis of data presentation, control charting, and capability indices. Statistical theory is introduced in a practical context, usually by way of numerical examples. Several methods familiar to statisticians have been simplified to make them more accessible. Suitable tabulations of these functions are included; in several cases, effective and simple approximations are offered. Contents Data Collection and Graphical Summaries Numerical Data Summaries-Location and Dispersion Probability and Distribution Sampling, Estimation, and Confidence Sample Tests of Hypothesis; "Significance Tests" Control Charts for Process Management and Improvement Control Charts for Average and Variation Control Charts for "Single-Valued" Observations Control Charts for Attributes and Events Control Charts: Problems and Special Cases Cusum Methods Process Capability-Attributes, Events, and Normally Distributed Data Capability; Non-Normal Distributions Evaluating the Precision of a Measurement System (Gauge Capability) Getting More from Control Chart Data SPC in "Non-Product" Applications Appendices

A propos du livre

À propos de l?auteur

D Bissell

Détails de l'édition

• Éditeur: Chapman and Hall/CRC
• Date d'édition: 1994
• Langue: anglais
• ISBN 10: 0412394405
• ISBN 13: 9780412394409
• Reliure: Relié
• Nombre de pages: 386
• Éditeur: Chatfield Chris, Zidek Jim, Lindsey Jim
• Coordonnées du fabricant: non disponible
• Personne responsable: non disponible