This book is the second edition of Design to Test. The first edition, written by myself and H. Frank Binnendyk and first published in 1982, has undergone several printings and become a standard in many companies, even in some countries. Both Frank and I are very proud of the success that our customers have had in utilizing the information, all of it still applicable to today's electronic designs. But six years is a long time in any technology field. I therefore felt it was time to write a new edition. This new edition, while retaining the basic testability prin- ciples first documented six years ago, contains the latest material on state-of-the-art testability techniques for electronic devices, boards, and systems and has been completely rewritten and up- dated. Chapter 15 from the first edition has been converted to an appendix. Chapter 6 has been expanded to cover the latest tech- nology devices. Chapter 1 has been revised, and several examples throughout the book have been revised and updated. But some- times the more things change, the more they stay the same. All of the guidelines and information presented in this book deal with the three basic testability principles-partitioning, control, and visibility. They have not changed in years. But many people have gotten smarter about how to implement those three basic test- ability principles, and it is the aim of this text to enlighten the reader regarding those new (and old) testability implementation techniques.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
EUR 25 expédition depuis Pays-Bas vers Etats-Unis
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368 p. Hardcover with dustjacket (Name clipped from the first free endpaper, otherwise in good condition.). N° de réf. du vendeur 020520
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Vendeur : BookDepart, Shepherdstown, WV, Etats-Unis
Hardcover. Etat : UsedVeryGood. Hardcover, 2nd edition; light fading, light shelf wear to exterior; otherwise in very good condition with clean text, firm binding. Dust jacket, fading, scuffing, and edge wear. N° de réf. du vendeur 22190
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Vendeur : Phoenix Books/Joanne's Used Books, Los Banos, CA, Etats-Unis
Hardback. Etat : Good. Etat de la jaquette : Good. First Edition. Design to Test by Turino Jon Van Nostrand, 1990 2nd ed, lst. print, ISBN:0442001703 Hardback in good condition with good dust jacket. Text is clean and unmarked, binding tight. Cover is clean, dust jacket shows little signs of wear. This is about electronic circuit designs and how complex they are and how testability become even more complex. This book contains reliable testability techniques for both digital and analog circuit boards. Loaded with charts, graphs, and illustrations of all kinds. Biography. Index, 378 pages. Book. N° de réf. du vendeur 004774
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hardcover. Etat : New. New Inside and Out! Crisp pages w/no markings!Dust cover has very minor shelf wear! N° de réf. du vendeur 231022010
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