Digital Integrated Circuit Testing from a Quality Perspective - Couverture rigide

Hnatek, Eugene R.

 
9780442006433: Digital Integrated Circuit Testing from a Quality Perspective

Synopsis

Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a

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