Reliability and Resilience in the Internet of Things explains the latest advances in reliability and resilience modeling, analysis, and design techniques for Internet of Things (IoT) systems. Over the last decade, IoT has developed rapidly, and it now spans diverse application domains such as healthcare, home automation, smart manufacturing, smart ocean, and smart agriculture. Due to the critical nature of these applications, it is imperative that the IoT systems operate reliably throughout the intended mission time. This timely book provides state-of the-art coverage on IoT reliability and resilience modeling, analysis, and design methods and solutions to help prevent costly malfunctions. From the viewpoint of engineers, researchers, and developers, reliability analysis and resilience design are key to the deployment and operation of IoT systems in critical applications, and this book contains the best advice on the subject available. It is a valuable resource for researchers in academia and industry interested in smart IoT systems and Industry 4.0.
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Liudong Xing is currently a professor at the Department of Electrical and Computer Engineering, University of Massachusetts, Dartmouth, United States. Her research interests include reliability and resilience modeling, analysis, and optimization of complex systems and networks (e.g., IoT and wireless sensor networks). Prof. Xing has received multiple teaching and scholar awards and was corecipient of the Best (Student) Paper Award at several international conferences and journals. She has published over 290 journal articles, and 2 books titled Binary Decision Diagrams and Extensions for System Reliability Analysis and Dynamic System Reliability: Modeling and Analysis of Dynamic and Dependent Behaviors. She has served as an associate editor or editorial board member of multiple journals, including Reliability Engineering & System Safety, IEEE Internet of Things Journal, IEEE Access, and International Journal of Mathematical, Engineering and Management Sciences. She is a fellow of the International Society of Engineering Asset Management and a senior member of IEEE.
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