Ion beam surface layer analysis;: Proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by ... Science Foundation and the IBM Corporation - Couverture rigide

9780444195364: Ion beam surface layer analysis;: Proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by ... Science Foundation and the IBM Corporation

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ISBN 10 : 044419536X ISBN 13 : 9780444195364

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Langue: anglais
ISBN 10: 044419536X
ISBN 13: 9780444195364
Reliure: Reli�
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Ion Beam Surface Layer Analysis (Conference Proceedings)

Mayer, James W., And James F. Ziegler

Edit� par Elsevier Sequoia S. A., 1974

ISBN 10 : 044419536X ISBN 13 : 9780444195364

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Hardcover. Etat : UsedGood. Proceedings of the International Conference held on June 18-20, 1973, in Yo rktown Heights, N.Y., and Sponsored by the National Science Foundation and the IBM Corporation. Hardcover; surplus library copy with the usual stampin gs; reference number taped to spine; bar code and checkout sheet taped to f ront cover; fading and shelf wear to exterior; in good condition with clean text and tight binding. N� de r�f. du vendeur 87851

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