Ellipsometry and Polarized Light - Couverture souple

Azzam, R.M.A.; Bashara, N.M.

Couverture souple

ISBN 10 : 0444870164 ISBN 13 : 9780444870162

Editeur : Elsevier Science Ltd, 1987

Synopsis

Ellipsometry is a unique optical technique of great sensitivity for in situ non-destructive characterization of surface (inter-facial) phenomena (reactions) utilizing the change in the state of polarization of a light-wave probe. Although known for almost a century, the use of ellipsometry has increased rapidly in the last two decades. Among the most significant recent developments are new applications, novel and automated instrumentation and techniques for error-free data analysis. This book provides the necessary analytical and experimental tools needed for competent understanding and use of these developments. It is directed to those who are already working in the field and, more importantly, to the newcomer who would otherwise have to sift through several hundred published papers. The authors first present a comprehensive study of the different mathematical representations of polarized light and how such light is processed by optical systems, going on to show how these tools are applied to the analysis of ellipsometer systems. To relate ellipsometric measurements to surface properties, use is then made of electromagnetic theory.

Détails de l'édition

• Éditeur: Elsevier Science Ltd
• Date d'édition: 1987
• Langue: anglais
• ISBN 10: 0444870164
• ISBN 13: 9780444870162
• Reliure: Broché
• Nombre de pages: 558
• Coordonnées du fabricant: non disponible
• Personne responsable: non disponible