Analytical Techniques for the Characterization of Compound Semi-Conductors: Proceedings of Symposium on Analytical Techniques for the Characterization - Couverture rigide

 
9780444891969: Analytical Techniques for the Characterization of Compound Semi-Conductors: Proceedings of Symposium on Analytical Techniques for the Characterization
Couverture rigide
ISBN 10 : 044489196X ISBN 13 : 9780444891969
Editeur : Elsevier Science Ltd, 1991

Synopsis

This volume is a collection of 96 papers presented at the above Conference. The scope of the work includes optical and electrical methods as well as techniques for structural and compositional characterization. The contributed papers report on topics such as X-ray diffraction, TEM, depth profiling, photoluminescence, Raman scattering and various electrical methods. Of particular interest are combinations of different techniques providing complementary information. The compound semiconductors reviewed belong mainly to the III-V and III-VI families. The papers in this volume will provide a useful reference on the implications of new technologies in the characterization of compound semiconductors.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Éditeur
Elsevier Science Ltd
Date d'édition
1991
Langue
anglais
ISBN 10 
044489196X
ISBN 13 
9780444891969
Reliure
Relié
Nombre de pages
554
Éditeur
Bastard Gerald, Oppolzer H.
Coordonnées du fabricant
non disponible
Personne responsable
non disponible