Self-Testing Vlsi Design - Couverture rigide

Yarmolik, Vyacheslav Nikolaevich; Kachan, I.V.

Couverture rigide

ISBN 10 : 0444896406 ISBN 13 : 9780444896407

Editeur : Elsevier Science Ltd, 1993

Synopsis

A distinctive feature of modern computer equipment development is the continuous increase in functionality and complexity of computer components. As a result of these advances, very large-scale integration (VLSI) circuits have found extensive application in the manufacture of computer products, personal computers included. Among a variety of recently evolved VLSI design technologies, the self-test VLSI design has gained particular prominence. The present study provides a current review on the problems of self-test VLSI design. A summary is given on self-test VLSI design results that have been obtained by scientists in leading scientific centres for computer integrated circuits. Emphasis is placed on the theoretical fundamentals of designing self-test VLSI building blocks, such as built-in test generators and output response analyzers. Particular attention is paid to: structural design of self-test VLSI circuits; design of universal modules for self-test VLSI circuits; and examination of the VLSI circuits for signature testability. It has been demonstrated that the design-for-testability techniques employed by this method provide ideal conditions for the straightforward implementation of self-test concepts. The work should prove useful for all those interested in both the basic facts and current research in this field.

Détails de l'édition

• Éditeur: Elsevier Science Ltd
• Date d'édition: 1993
• Langue: anglais
• ISBN 10: 0444896406
• ISBN 13: 9780444896407
• Reliure: Relié
• Nombre de pages: 358
• Coordonnées du fabricant: non disponible
• Personne responsable: Barbara Criscuolo; b.criscuolo@lswr.it; ; Via Spadolini, 7; Milano; 20141; Italie