Articles liés à Two-Dimensional X-Ray Diffraction

Two-Dimensional X-Ray Diffraction - Couverture rigide

He, Bob B.

 
9780470227220: Two-Dimensional X-Ray Diffraction
Couverture rigide
ISBN 10 : 0470227222 ISBN 13 : 9780470227220
Editeur : Wiley-Blackwell, 2009

Synopsis

Written by one of the pioneers of 2D X-Ray Diffraction, this useful guide covers the fundamentals, experimental methods and applications of two-dimensional x-ray diffraction, including geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis and combinatorial screening. Experimental examples in materials research, pharmaceuticals, and forensics are also given. This presents a key resource to researchers in materials science, chemistry, physics, and pharmaceuticals, as well as graduate-level students in these areas.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

À propos de l'auteur

Bob Baoping He is the Director of R&D and Engineering at Bruker AXS (formerly Siemens AXS). Mr. He holds a PhD in materials science from Virginia Tech and holds twelve U.S. patents.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Wiley-Blackwell
Date d'édition
2009
Langue
anglais
ISBN 10 
0470227222
ISBN 13 
9780470227220
Reliure
Relié
Nombre de pages
426
Coordonnées du fabricant
non disponible
Personne responsable
non disponible