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Aberration-Corrected Analytical Transmission Electron Microscopy - Couverture rigide

 
9780470518519: Aberration-Corrected Analytical Transmission Electron Microscopy

Synopsis

The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

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À propos de l'auteur

Professor R.M.D. (Rik) Brydson is based in the School of Process, Environmental and Materials Engineering at the University of Leeds, UK. He is a committee member for the European Microscopy Society as well as the Electron Microscopy and Analysis Group (Institute of Physics).

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.