Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications - Couverture rigide

Haugstad, Greg

Couverture rigide

ISBN 10 : 0470638826 ISBN 13 : 9780470638828

Editeur : John Wiley & Sons Inc, 2012

Synopsis

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.

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A propos du livre

À propos de l'auteur

GREG HAUGSTAD, PhD, is a technical staff member and Director of the Characterization Facility in the College of Science and Engineering at the University of Minnesota. He has collaborated with industry professionals on such technologies as medical X-ray imaging media, lubrication, inkjet printing, and more recently on biomedical device coatings. He teaches undergraduate and graduate AFM courses, as well as short professional courses, and has trained over 600 AFM users.

Détails de l'édition

• Éditeur: John Wiley & Sons Inc
• Date d'édition: 2012
• Langue: anglais
• ISBN 10: 0470638826
• ISBN 13: 9780470638828
• Reliure: Relié
• Nombre de pages: 528
• Coordonnées du fabricant: JOSSEY-BASS; https://www.wiley.com/en-us; ; 111 River Street; Hoboken; NJ; 7030; Etats-Unis
• Personne responsable: non disponible