Materials Characterization: Introduction to Microscopic and Spectroscopic Methods - Couverture rigide

Leng, Y

Couverture rigide

ISBN 10 : 0470822988 ISBN 13 : 9780470822982

Editeur : Wiley-Blackwell, 2008

Synopsis

This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.

A propos du livre

À propos de l'auteur

Yang Leng is a Professor of Materials Science at Hong Kong University of Science and Technology. His research focuses on mechanical behavior of engineering materials, biomedical materials, and novel materials processing. Professor Leng has authored nearly 80 papers in international journals and has been granted two US patents. In addition, he commissioned more than a dozen industrial reports. His contribution to teaching materials science is exemplified by the Teaching Excellence Appreciation award from the HKUST.

Détails de l'édition

• Éditeur: Wiley-Blackwell
• Date d'édition: 2008
• Langue: anglais
• ISBN 10: 0470822988
• ISBN 13: 9780470822982
• Reliure: Relié
• Nombre de pages: 384
• Coordonnées du fabricant: non disponible
• Personne responsable: non disponible