A one-of-a-kind presentation of the major achievements in statistical profile monitoring methods
Statistical profile monitoring is an area of statistical quality control that is growing in significance for researchers and practitioners, specifically because of its range of applicability across various service and manufacturing settings. Comprised of contributions from renowned academicians and practitioners in the field, Statistical Analysis of Profile Monitoring presents the latest state-of-the-art research on the use of control charts to monitor process and product quality profiles. The book presents comprehensive coverage of profile monitoring definitions, techniques, models, and application examples, particularly in various areas of engineering and statistics.
The book begins with an introduction to the concept of profile monitoring and its applications in practice. Subsequent chapters explore the fundamental concepts, methods, and issues related to statistical profile monitoring, with topics of coverage including:
Throughout the book, more than two dozen real-world case studies highlight the discussed topics along with innovative examples and applications of profile monitoring. Statistical Analysis of Profile Monitoring is an excellent book for courses on statistical quality control at the graduate level. It also serves as a valuable reference for quality engineers, researchers and anyone who works in monitoring and improving statistical processes.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
RASSOUL NOOROSSANA, PhD, is Professor of Industrial Engineering at Iran University of Science and Technology. A Certified Six Sigma Black Belt, he has published extensively in the areas of statistical quality control, engineering statistics, total quality management, and Six Sigma.
ABBAS SAGHAEI, PhD, is Associate Professor of Industrial Engineering at Islamic Azad University, Iran. He currently focuses his research in the areas of statistical process control, design of experiments, and Six Sigma.
AMIRHOSSEIN AMIRI, PhD, is Assistant Professor of Industrial Engineering at Shahed University, Iran. He has authored numerous papers in the areas of statistical process control and improvement, quality management and productivity, and design of experiments.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
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Etat : New. * This is the first book of its kind on the subject. It is written by experts in the field (such as J.D. Williams of General Electric Global Research, Jeffrey B. Birch at VPI, and Longcheen Huwang of the Institute of Statistics at Tsing Hua University Hsin Chu). It is current and presents state-of-the-art materials. Series: Wiley Series in Probability and Statistics. Num Pages: 332 pages, Illustrations. BIC Classification: KJMV5; PBT; TGPQ. Category: (P) Professional & Vocational. Dimension: 245 x 164 x 22. Weight in Grams: 632. . 2011. 1st Edition. Hardcover. . . . . N° de réf. du vendeur V9780470903223
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Hardcover. Etat : new. Hardcover. A one-of-a-kind presentation of the major achievements in statistical profile monitoring methods Statistical profile monitoring is an area of statistical quality control that is growing in significance for researchers and practitioners, specifically because of its range of applicability across various service and manufacturing settings. Comprised of contributions from renowned academicians and practitioners in the field, Statistical Analysis of Profile Monitoring presents the latest state-of-the-art research on the use of control charts to monitor process and product quality profiles. The book presents comprehensive coverage of profile monitoring definitions, techniques, models, and application examples, particularly in various areas of engineering and statistics. The book begins with an introduction to the concept of profile monitoring and its applications in practice. Subsequent chapters explore the fundamental concepts, methods, and issues related to statistical profile monitoring, with topics of coverage including: Simple and multiple linear profilesBinary response profilesParametric and nonparametric nonlinear profilesMultivariate linear profiles monitoringStatistical process control for geometric specificationsCorrelation and autocorrelation in profilesNonparametric profile monitoring Throughout the book, more than two dozen real-world case studies highlight the discussed topics along with innovative examples and applications of profile monitoring. Statistical Analysis of Profile Monitoring is an excellent book for courses on statistical quality control at the graduate level. It also serves as a valuable reference for quality engineers, researchers and anyone who works in monitoring and improving statistical processes. * This is the first book of its kind on the subject. It is written by experts in the field (such as J.D. Williams of General Electric Global Research, Jeffrey B. Birch at VPI, and Longcheen Huwang of the Institute of Statistics at Tsing Hua University Hsin Chu). It is current and presents state-of-the-art materials. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. N° de réf. du vendeur 9780470903223
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