Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends - Couverture rigide

Benninghoven, A.; Etc.; Rudenauer, F. G.; Werner, H. W.

Couverture rigide

ISBN 10 : 0471010561 ISBN 13 : 9780471010562

Editeur : John Wiley & Sons Inc, 1987

Synopsis

Other titles for the analytical chemist Tandem Mass Spectrometry Edited by F. W. McLafferty Experts in tandem mass spectrometry bring this changing field up to date with a review of recent dramatic applications. Discusses amino acid sequencing, analysis of mixtures for trace level impurities, chemotaxonomy, and the classification of natural products. 1983 (0 471-86597-4) 506 pp. Fourier Transform Infrared Spectrometry Peter R. Griffiths and James A. de Haseth An up-to-date introduction to the theory, instrumentation and applications of FT-IR spectrometry, including new and emerging techniques. Designed to allow actual and potential users of the technique to plan their experimental procedures correctly. Easy-to-read, logical presentation makes this sophisticated subject accessible to students as well as chemists and analysts. 1986 (0 471-09902-3) 656pp. Practical Aspects of Gas Chromatography/Mass Spectrometry Gordon M. Message "a valuable and comprehensive reference that will help scientists to obtain a greater understanding of their GC/MS systems" Journal of American Chemical Society A single-source reference describing how and why gas chromatography and mass spectrometry instruments work. Describes a wide rage of technologies and offers guidance for their optimum use, outlining good practice, routine procedures, and trouble shooting. 1984 (0 471-06277-4) 351 pp.

A propos du livre

À propos de l'auteur

About the authors A. Benninghoven is Professor of Physics at the University of Munster in the Federal Republic of Germany. F. G. Rudenauer is Head, Ion and Vacuum Physics Group at the Research Center, Seibersdorf, Austria. He received his PhD in physics and mathematics at the University of Vienna in 1967. H. W. Werner is head of the Department for Structure Analysis at Philips Research Laboratories, The Netherlands, where he has been since 1958. He received his PhD in physics from the University of Graz in 1958.

Détails de l'édition

• Éditeur: John Wiley & Sons Inc
• Date d'édition: 1987
• Langue: anglais
• ISBN 10: 0471010561
• ISBN 13: 9780471010562
• Reliure: Relié
• Nombre de pages: 1264
• Coordonnées du fabricant: non disponible
• Personne responsable: non disponible