Articles liés à New Characterization Techniques for Thin Polymer Films

New Characterization Techniques for Thin Polymer Films - Couverture rigide

Tong, Ho-ming; Nguyen, Luu T.

 
9780471623465: New Characterization Techniques for Thin Polymer Films
Couverture rigide
ISBN 10 : 0471623466 ISBN 13 : 9780471623465
Editeur : John Wiley & Sons Inc, 1990

Synopsis

This book covers principles, advantages and drawbacks of recently developed methods for characterization of thin films. Each chapter is self-sufficient with its own separate section on background, theory, experimental set-up and procedures, and applications.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

Various industries and universities have aimed their activities toward the development of highly sensitive techniques capable of studying ultrathin polymer films. Provides researchers with a working description of the principles of operation, areas of application and data analysis methods for some of the newly developed techniques, as well as sufficient references for future in–depth studies of thin polymer films. The techniques covered are divided into two groups––bulk property measurements and surface/interface property measurements––with chapters covering microdielectrometry, stress measurement by x–ray diffraction, laser interferometry, ion beam analysis, photothermal analysis, and XPS/SIMS/AES, among other techniques. Abstracts for each of the chapters are conveniently located in the preface.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
John Wiley & Sons Inc
Date d'édition
1990
Langue
anglais
ISBN 10 
0471623466
ISBN 13 
9780471623465
Reliure
Relié
Nombre de pages
368
Coordonnées du fabricant
non disponible
Personne responsable
non disponible