Articles liés à Built-In Test for Vsli: Pseudorandom Techniques

Built-In Test for Vsli: Pseudorandom Techniques - Couverture rigide

Bardell, Paul H.; McAnney, W. H.; Savir, J.

 
9780471624639: Built-In Test for Vsli: Pseudorandom Techniques
Couverture rigide
ISBN 10 : 0471624632 ISBN 13 : 9780471624639
Editeur : Wiley-Interscience, 1987

Synopsis

This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing. Also details random and memory testing and the problems of assessing the efficiency of such tests, and the limitations and practical concerns of built-in testing.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

À propos de l'auteur

Paul H. Bardell and W. H. McAnney are the authors of Built In Test for VLSI: Pseudorandom Techniques, published by Wiley.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Wiley-Interscience
Date d'édition
1987
Langue
anglais
ISBN 10 
0471624632
ISBN 13 
9780471624639
Reliure
Relié
Nombre de pages
368
Coordonnées du fabricant
non disponible
Personne responsable
non disponible