Surface Analysis Polymers - Couverture souple

Briggs, D.

 
9780521017534: Surface Analysis Polymers
Couverture souple
ISBN 10 : 052101753X ISBN 13 : 9780521017534
Editeur : Cambridge University Press, 2008

Synopsis

This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Revue de presse

'... an excellent introduction to the field. The book is well organised, has a good index and there are numerous diagrams and figures supporting throughout. Overall, this is a super book that will rapidly become a standard text and a must for the library of any serious surface or polymer group.' Martyn C. Davies, Chemistry in Britain

' ... a useful introductory text on the subject ... The book is well produced and leads the reader clearly through the basic principles to the more subtle features of the topic. I can recommend this publication to those wishing to gain a better understanding of the way to characterise such materials using these techniques.' C. A. Finch, Polymer International

' ... the author is to be congratulated on achieving his aim of an 'in-depth' treatment of the subject matter in a concise and readable style. This is excellent value for money and is thoroughly recommended to all practising, or aspiring, surface analysts with an interest in polymers.' John F. Watts, The Analyst

Présentation de l'éditeur

This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Cambridge University Press
Date d'édition
2008
Langue
anglais
ISBN 10 
052101753X
ISBN 13 
9780521017534
Reliure
Broché
Nombre de pages
216
Coordonnées du fabricant
non disponible
Personne responsable
Avery
https://www.avery.fr/

chemin des peupliers 27
Dardilly
France