Articles liés à Reflection Electron Microscopy and spectotrophy for...
Synopsis
A self-contained book on electron microscopy and spectrometry techniques for surface studies.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Revue de presse
'A very complete review of all work performed in reflection electron microscopy with an exhaustive bibliography ... It forms an exciting support for the understanding of surface studies by reflection electron microscopy. Illustrated by many beautiful and pertinent REM images and well-designed line drawings, this book should certainly be useful for graduate students and scientists working on surface characterization.' Andre Rocher, Measurement Science & Technology
'For those with a TEM background it represents, perhaps, the definitive text for reflection methods ... extremely readable ... attractive style ... Dr. Wang is to be congratulated on writing a very accesible text. The book is thoroughly recommended.' John F. Watts, The Analyst
' ... a very pleasing volume which should attract new users to these techniques.' P. W. Hawkes, Ultramicroscopy
' ... this book provides a comprehensive review of theory, techniques and applications of reflection electron microscopy.' Aslib Book Guide
Présentation de l'éditeur
In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Edité par
Cambridge University Press, 2005
ISBN 10 : 0521017955
ISBN 13 : 9780521017954
Neuf
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Edité par
Cambridge University Press, 2005
ISBN 10 : 0521017955
ISBN 13 : 9780521017954
Neuf
Couverture souple
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis (Paperback)
Edité par
Cambridge University Press, Cambridge, 2005
ISBN 10 : 0521017955
ISBN 13 : 9780521017954
Neuf
Paperback
Vendeur : Grand Eagle Retail, Mason, OH, Etats-Unis
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Paperback. Etat : new. Paperback. In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature. Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. N° de réf. du vendeur 9780521017954
Quantité disponible : 1 disponible(s)
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Edité par
Cambridge University Press, 2005
ISBN 10 : 0521017955
ISBN 13 : 9780521017954
Neuf
Couverture souple
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
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Reflection Electron Microscopy and spectotrophy for surface analysis
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Cambridge University Press 2008-11-12, 2008
ISBN 10 : 0521017955
ISBN 13 : 9780521017954
Neuf
Paperback
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Edité par
Cambridge University Press, 2005
ISBN 10 : 0521017955
ISBN 13 : 9780521017954
Neuf
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
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Paperback. Etat : Brand New. 456 pages. 9.50x6.70x1.10 inches. In Stock. This item is printed on demand. N° de réf. du vendeur __0521017955
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis (Paperback)
Edité par
Cambridge University Press, Cambridge, 2005
ISBN 10 : 0521017955
ISBN 13 : 9780521017954
Neuf
Paperback
Vendeur : CitiRetail, Stevenage, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
Paperback. Etat : new. Paperback. In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature. Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. N° de réf. du vendeur 9780521017954
Quantité disponible : 1 disponible(s)
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis (Paperback)
Edité par
Cambridge University Press, Cambridge, 2005
ISBN 10 : 0521017955
ISBN 13 : 9780521017954
Neuf
Paperback
Vendeur : AussieBookSeller, Truganina, VIC, Australie
Évaluation du vendeur 5 sur 5 étoiles
Paperback. Etat : new. Paperback. In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature. Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. N° de réf. du vendeur 9780521017954
Quantité disponible : 1 disponible(s)
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Edité par
Cambridge University Press, 2005
ISBN 10 : 0521017955
ISBN 13 : 9780521017954
Neuf
Couverture souple
Vendeur : moluna, Greven, Allemagne
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applicat. N° de réf. du vendeur 446920820
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