Electron Microprobe Analysis and Scanning Electron Microscopy in Geology - Couverture souple

Reed, S

 
9780521142304: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
Couverture souple
ISBN 10 : 052114230X ISBN 13 : 9780521142304
Editeur : Cambridge University Press, 2010

Synopsis

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Revue de presse

Review of the hardback: 'The subject is treated in a clear and logical fashion ... Dr Reed has produced an excellent and thoroughly readable book ... highly recommended for all those who use the electron microprobe.' Allan Pring, Geological Magazine

Review of the hardback: 'A good introductory level of information on all the main aspects of scanning electron microscopy and microanalysis that is not so readily available anywhere else. The book is well illustrated and written in a clear and readable style ... It is strongly recommended for new users and should have a place in every laboratory. It would make an excellent textbook for introductory courses.' M. T. Styles, Analyst

Review of the hardback: 'This book is a valuable introduction to the use and geological application of scanning electron microscopes and electron microprobes ... by far the most readable of the microscope/microprobe books that I have seen ... It is pitched at the right level for the market at which it is aimed, postgraduate and postdoctoral workers, or geologists in industrial laboratories ... It is a splendid book that should sit on the bookshelf of anybody working with electron microscopes and microprobes, be part of any laboratory and be required reading for any graduate student working with microbeam techniques.' Peter Treloar, Geoscientist

Review of the hardback: ' ...this is a book that has been long overdue, and will certainly go to the top of my students' reading list.' Eric Condliffe, Journal of Petrology

Présentation de l'éditeur

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Cambridge University Press
Date d'édition
2010
Langue
anglais
ISBN 10 
052114230X
ISBN 13 
9780521142304
Reliure
Broché
Numéro d'édition
2
Nombre de pages
212
Coordonnées du fabricant
non disponible
Personne responsable
Avery
https://www.avery.fr/

chemin des peupliers 27
Dardilly
France

Autres éditions populaires du même titre

9780521848756: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

Edition présentée

ISBN 10 :  052184875X ISBN 13 :  9780521848756
Editeur : Cambridge University Press, 2005
Couverture rigide