Modeling and Characterization of Rf and Microwave Power Fets - Couverture souple

Aaen, Peter H.

Couverture souple

ISBN 10 : 0521336171 ISBN 13 : 9780521336178

Editeur : Cambridge University Press, 2011

Synopsis

This book was the first to be devoted to the compact modeling of RF power FETs.

A propos du livre

Présentation de l'éditeur

This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices.

Revue de presse

Review of the hardback: '... a well-written and useful text ... a coherent review of the advanced state of power FET modelling and characterisation.' IEEE Microwave Magazine

Détails de l'édition

• Éditeur: Cambridge University Press
• Date d'édition: 2011
• Langue: anglais
• ISBN 10: 0521336171
• ISBN 13: 9780521336178
• Reliure: Broché
• Numéro d'édition: 1
• Nombre de pages: 380
• Coordonnées du fabricant: non disponible
• Personne responsable: Avery; https://www.avery.fr/; ; chemin des peupliers 27; Dardilly; France