Reflection High-Energy Electron Diffraction - Couverture rigide

Ichimiya, Ayahiko; Cohen, Philip I.

Couverture rigide

ISBN 10 : 0521453739 ISBN 13 : 9780521453738

Editeur : Cambridge University Press, 2004

Synopsis

Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts, explaining how to analyze RHEED patterns. For beginners the principles of electron diffraction are explained and many examples of the interpretation of RHEED patterns are described. The second part of the book contains detailed descriptions of RHEED theory. The third part applies RHEED to the determination of surface structures, gives detailed descriptions of the effects of disorder, and critically reviews the mechanisms contributing to RHEED intensity oscillations. This unified and coherent account will appeal to both graduate students and researchers in the study of molecular beam epitaxial growth.

A propos du livre

À propos de l?auteur

Ayahiko Ichimiya is a Professor in the Department of Quantum Engineering, Nagoya University. Philip I. Cohen is a Professor in the Department of Electrical and Computer Engineering, University of Minnesota.

Détails de l'édition

• Éditeur: Cambridge University Press
• Date d'édition: 2004
• Langue: anglais
• ISBN 10: 0521453739
• ISBN 13: 9780521453738
• Reliure: Relié
• Nombre de pages: 366
• Coordonnées du fabricant: non disponible
• Personne responsable: Avery; https://www.avery.fr/; ; chemin des peupliers 27; Dardilly; France