Fundamentals of Modern VLSI Devices - Couverture souple

Taur, Yuan; Ning, Tak H.

 
9780521559591: Fundamentals of Modern VLSI Devices
Couverture souple
ISBN 10 : 0521559596 ISBN 13 : 9780521559591
Editeur : Cambridge University Press, 1998

Synopsis

This book examines in detail the basic properties and design, including chip integration, of CMOS and bipolar VLSI devices and discusses the various factors that affect their performance. The authors begin with a thorough review of the relevant aspects of semiconductor physics, and proceed to a description of the design of CMOS and bipolar devices. The optimization of these devices for VLSI applications is also covered. The authors highlight the intricate interdependencies and subtle trade-offs between those device parameters, such as power consumption and packing density, that affect circuit performance and manufacturability. They also discuss in detail the scaling, and physical limits to the scaling, of CMOS and bipolar devices. The book contains many exercises, and can be used as a textbook for senior undergraduate or first-year graduate courses on microelectronics or VLSI devices. It will also be a valuable reference volume for practising engineers involved in research and development in the electronics industry.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

This book examines in detail the basic properties and design, including chip integration, of CMOS and bipolar VLSI devices and discusses the various factors that affect their performance. The authors begin with a thorough review of the relevant aspects of semiconductor physics, and proceed to a description of the design of CMOS and bipolar devices. The optimization of these devices for VLSI applications is also covered. The authors highlight the intricate interdependencies and subtle trade-offs between those device parameters, such as power consumption and packing density, that affect circuit performance and manufacturability. They also discuss in detail the scaling, and physical limits to the scaling, of CMOS and bipolar devices. The book contains many exercises, and can be used as a textbook for senior undergraduate or first-year graduate courses on microelectronics or VLSI devices. It will also be a valuable reference volume for practising engineers involved in research and development in the electronics industry.

Revue de presse

' ... well-written classroom text on VLSI devices ... this book will also prove valuable to practicing designers and researchers because of the many advanced topics included, covers a wide range of material for its size ... The book is logically organized. Both the ideas and the presentation are first-rate. The typesetting and diagrams are superb.' Computing Reviews

'Taur and Ning have written a book that will surely be referenced for many years. it is clear that the authors know what they are talking about (they are both IEEE Fellows and long-time employees of IBM). they draw heavily from their experience of industrial VLSI technology, and cover subjects such as device optimization, trade-offs between power consumption and packing density, and physical limits to scaling.' Carol-Mikael Zetterling, Royal Insitute of Technology, Stockholm

' ... a book that will surely be referenced for many years.' Carl-Mikael Zetterling, Amazon

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Cambridge University Press
Date d'édition
1998
Langue
anglais
ISBN 10 
0521559596
ISBN 13 
9780521559591
Reliure
Broché
Nombre de pages
496
Coordonnées du fabricant
non disponible
Personne responsable
Avery
https://www.avery.fr/

chemin des peupliers 27
Dardilly
France

Autres éditions populaires du même titre

9781107635715: Fundamentals of Modern VLSI Devices

Edition présentée

ISBN 10 :  1107635713 ISBN 13 :  9781107635715
Editeur : Cambridge University Press, 2013
Couverture souple