Articles liés à Focused Ion Beam Systems: Basics and Applications
Synopsis
This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
À propos de l?auteur
NAN YAO holds several positions at Princeton University, New Jersey. He is director of the Imaging and Analysis Center; Senior Research Scholar at the Institute for the Science and Technology of Materials; and a lecturer in Mechanical and Aerospace Engineering.
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Focused Ion Beam Systems: Basics and Applications
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Cambridge University Press, 2007
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Focused Ion Beam Systems: Basics and Applications
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Focused Ion Beam Systems: Basics and Applications
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Focused Ion Beam Systems: Basics and Applications
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Focused Ion Beam Systems: Basics and Applications
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Focused Ion Beam Systems
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Cambridge University Press, 2013
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Gebunden. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuab. N° de réf. du vendeur 446949426
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Focused Ion Beam Systems (Hardcover)
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Cambridge University Press, Cambridge, 2007
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Hardcover. Etat : new. Hardcover. The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology. This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuable resource for researchers in materials science, electrical engineering and nanotechnology. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. N° de réf. du vendeur 9780521831994
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Focused Ion Beam Systems
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Cambridge University Press CUP, 2007
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Etat : New. pp. 408. N° de réf. du vendeur 26397820
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Focused Ion Beam Systems : Basics and Applications
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Cambridge University Press, 2007
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ISBN 13 : 9780521831994
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Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
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Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume comprehensively covers the state-of-the-art in ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic, and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology. N° de réf. du vendeur 9780521831994
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Focused Ion Beam Systems
Edité par
Cambridge University Press, 2007
ISBN 10 : 0521831997
ISBN 13 : 9780521831994
Neuf
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Vendeur : Majestic Books, Hounslow, Royaume-Uni
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Etat : New. Print on Demand pp. 408 69:B&W 6.69 x 9.61 in or 244 x 170 mm (Pinched Crown) Case Laminate on White w/Gloss Lam. N° de réf. du vendeur 7450147
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