Electron Microprobe Analysis and Scanning Electron Microscopy in Geology - Couverture rigide

Reed, S. J. B.

Couverture rigide

ISBN 10 : 052184875X ISBN 13 : 9780521848756

Editeur : Cambridge University Press, 2005

Synopsis

This 2005 book covers principles and techniques of EMPA and SEM for geological graduate students and postdoctoral workers.

A propos du livre

Revue de presse

Review of the hardback: 'The subject is treated in a clear and logical fashion ... Dr Reed has produced an excellent and thoroughly readable book ... highly recommended for all those who use the electron microprobe.' Allan Pring, Geological Magazine

Review of the hardback: 'A good introductory level of information on all the main aspects of scanning electron microscopy and microanalysis that is not so readily available anywhere else. The book is well illustrated and written in a clear and readable style ... It is strongly recommended for new users and should have a place in every laboratory. It would make an excellent textbook for introductory courses.' M. T. Styles, Analyst

Review of the hardback: 'This book is a valuable introduction to the use and geological application of scanning electron microscopes and electron microprobes ... by far the most readable of the microscope/microprobe books that I have seen ... It is pitched at the right level for the market at which it is aimed, postgraduate and postdoctoral workers, or geologists in industrial laboratories ... It is a splendid book that should sit on the bookshelf of anybody working with electron microscopes and microprobes, be part of any laboratory and be required reading for any graduate student working with microbeam techniques.' Peter Treloar, Geoscientist

Review of the hardback: ' ...this is a book that has been long overdue, and will certainly go to the top of my students' reading list.' Eric Condliffe, Journal of Petrology

Présentation de l'éditeur

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Détails de l'édition

• Éditeur: Cambridge University Press
• Date d'édition: 2005
• Langue: anglais
• ISBN 10: 052184875X
• ISBN 13: 9780521848756
• Reliure: Relié
• Numéro d'édition: 2
• Nombre de pages: 232
• Coordonnées du fabricant: non disponible