Testlet Response Theory and Its Applications - Couverture rigide

Wainer, Howard; Bradlow, Eric T.; Wang, Xiaohui

Couverture rigide

ISBN 10 : 0521862728 ISBN 13 : 9780521862721

Editeur : Cambridge University Press, 2007

Synopsis

The first comprehensive description of a scoring model for tests composed of smaller tests focusing on narrow topics.

A propos du livre

À propos des auteurs

Dr Howard Wainer is a Distinguished Research Scientist for the National Board of Medical Examiners and Adjunct Professor of Statistics at the Wharton School of the University of Pennsylvania.

Eric T. Bradlow is the K. P. Chao Professor, Professor of Marketing and Statistics, and Academic Director of the Wharton Small Business Development Center, Wharton School of the University of Pennsylvania. Before joining the Wharton faculty, he worked in the Corporate Marketing and Business Research Division at the DuPont Corporation, and in the Statistics and Psychometrics Research Group at the Educational Testing Service. Bradlow was recently named a Fellow of the American Statistical Association.

Dr Xiaohui Wang is an Assistant Professor in the Department of Statistics at the University of Virginia. She worked as a Principal Data Analyst for three years in the Division of Data Analysis and Research Technology at the Educational Testing Service. She has twice received the National Council on Measurement in Education Award for Scientific Contribution to a Field of Educational Measurement.

Détails de l'édition

• Éditeur: Cambridge University Press
• Date d'édition: 2007
• Langue: anglais
• ISBN 10: 0521862728
• ISBN 13: 9780521862721
• Reliure: Relié
• Numéro d'édition: 1
• Nombre de pages: 280
• Coordonnées du fabricant: Cambridge University Press; https://www.cambridge.org/; ; Via Honduras,15; Pomezia; Italia; 71; Italie