Modeling and Characterization of RF and Microwave Power FETs - Couverture rigide

Aaen, Peter; Plá, Jaime A.; Wood, John

Couverture rigide

ISBN 10 : 0521870666 ISBN 13 : 9780521870665

Editeur : Cambridge University Press, 2007

Synopsis

This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices.

A propos du livre

À propos de l?auteur

Peter H. Aaen is the Modeling Group Manager in the RF Division at Freescale Semiconductor, Inc., Tempe Arizona. Jaime A. Pia is the Design Organization Manager in the RF Division at Freescale in the RF Division at Freescale Semiconductor, Inc., Tempe Arizona. John Wood is Senior Technical Contributor responsible for RF CAD and Modeling in the RF Division at Freescale Semiconductor, Inc., Tempe, Arizona. He is a Fellow of the IEEE.

Détails de l'édition

• Éditeur: Cambridge University Press
• Date d'édition: 2007
• Langue: anglais
• ISBN 10: 0521870666
• ISBN 13: 9780521870665
• Reliure: Relié
• Nombre de pages: 380
• Coordonnées du fabricant: non disponible
• Personne responsable: Avery; https://www.avery.fr/; ; chemin des peupliers 27; Dardilly; France