Scaling Effects on Metal-oxide-semiconductor Device Characteristics - Couverture rigide

Walstra, Steven

 
9780530002330: Scaling Effects on Metal-oxide-semiconductor Device Characteristics
Couverture rigide
ISBN 10 : 0530002337 ISBN 13 : 9780530002330
Editeur : Dissertation Discovery Company, 2019

Synopsis

Dissertation Discovery Company and University of Florida are dedicated to making scholarly works more discoverable and accessible throughout the world. This dissertation, "Scaling Effects on Metal-oxide-semiconductor Device Characteristics" by Steven V. Walstra, was obtained from University of Florida and is being sold with permission from the author. A digital copy of this work may also be found in the university's institutional repository, IR@UF. The content of this dissertation has not been altered in any way. We have altered the formatting in order to facilitate the ease of printing and reading of the dissertation.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Éditeur
Dissertation Discovery Company
Date d'édition
2019
Langue
anglais
ISBN 10 
0530002337
ISBN 13 
9780530002330
Reliure
Relié
Nombre de pages
152
Coordonnées du fabricant
Buchpark GmbH
https://www.buchpark.de

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Autres éditions populaires du même titre

9780530002323: Scaling Effects on Metal-oxide-semiconductor Device Characteristics

Edition présentée

ISBN 10 :  0530002329 ISBN 13 :  9780530002323
Editeur : Dissertation Discovery Company, 2019
Couverture souple