Articles liés à Digital Systems Testing and Testable Design
Synopsis
Book by Abramovici Miron
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Quatrième de couverture
This widely–used textbook provides comprehensive, state–of–the–art coverage of digital systems testing and testable design.
Considered a definitive text in this area, the book includes in–depth discussions of the following topics:
Test generation
Fault modeling for classic and new technologies
Simulation
Fault simulation
Design for testability
Built–in self–test Diagnosis
All topics are covered extensively, from fundamental concepts to advanced techniques.
Successfully used world–wide at leading universities, the book is appropriate for graduate–level and senior–level undergraduate courses. Numerous examples and problems help make the learning process easier for the reader. Test engineers, ASIC and system designers, and CAD developers will find it an invaluable tool to keep current with recent changes in the field.
Biographie de l'auteur
Miron Abramovici is a Distinguished Member of the Technical Staff at AT&T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago.
Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles.
Arthur D. Friedman is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University.
All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
- ÉditeurComputer Science Press
- Date d'édition1990
- ISBN 10 0716781794
- ISBN 13 9780716781790
- ReliureRelié
- Langueanglais
- Nombre de pages653
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Digital Systems Testing and Te
Edité par
W.H. Freeman & Company, 1990
ISBN 10 : 0716781794
ISBN 13 : 9780716781790
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Etat : Very Good. Item in very good condition! Textbooks may not include supplemental items i.e. CDs, access codes etc. N° de réf. du vendeur 00084009941
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Digital Systems Testing and Testable Design
Edité par
W.H. Freeman & Company, 1990
ISBN 10 : 0716781794
ISBN 13 : 9780716781790
Ancien ou d'occasion
Couverture rigide
Vendeur : ThriftBooks-Atlanta, AUSTELL, GA, Etats-Unis
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Hardcover. Etat : Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less 3. N° de réf. du vendeur G0716781794I4N00
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Digital Systems Testing and Testable Design
Edité par
W.H. Freeman & Company, 1990
ISBN 10 : 0716781794
ISBN 13 : 9780716781790
Ancien ou d'occasion
Couverture rigide
Vendeur : ThriftBooks-Dallas, Dallas, TX, Etats-Unis
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Hardcover. Etat : Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less 3. N° de réf. du vendeur G0716781794I3N00
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Digital Systems Testing and Testable Design (Electrical Engineering, Communications, and Signal Processin)
Edité par
Computer Science Press, 1990
ISBN 10 : 0716781794
ISBN 13 : 9780716781790
Ancien ou d'occasion
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Vendeur : HPB-Red, Dallas, TX, Etats-Unis
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hardcover. Etat : Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! N° de réf. du vendeur S_355151477
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Image d'archives
Digital Systems Testing and Testable Design (Electrical Engineering, Communications, and Signal Processin)
Edité par
Computer Science Press, 1990
ISBN 10 : 0716781794
ISBN 13 : 9780716781790
Ancien ou d'occasion
Couverture rigide
Vendeur : HPB-Red, Dallas, TX, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
hardcover. Etat : Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority! N° de réf. du vendeur S_378851924
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Image d'archives
Digital Systems Testing and Testable Design
Edité par
Computer Science Press, 1990
ISBN 10 : 0716781794
ISBN 13 : 9780716781790
Ancien ou d'occasion
Couverture rigide
Vendeur : Anybook.com, Lincoln, Royaume-Uni
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Etat : Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1450grams, ISBN:0716781794. N° de réf. du vendeur 9824716
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Digital Systems Testing and Testable Design
Edité par
Computer Science Press, 1990
ISBN 10 : 0716781794
ISBN 13 : 9780716781790
Ancien ou d'occasion
Couverture rigide
Edition originale
Vendeur : Reader's Corner, Inc., Raleigh, NC, Etats-Unis
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Hardcover. Etat : Near Fine. No Jacket. First Edition. Previous owner's name, blacked out, on the front flyleaf, otherwise a near fine unmarked hardcover first edition copy in a slick blue binding, no DJ. N° de réf. du vendeur 027697
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