Characterization and Metrology for Ulsi Technology 2003: International Conference on Characterization and Metrology for Ulsi Technology, Austin, Texas 24-28 March 2003 - Couverture rigide

9780735401525: Characterization and Metrology for Ulsi Technology 2003: International Conference on Characterization and Metrology for Ulsi Technology, Austin, Texas 24-28 March 2003

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ISBN 10 : 0735401527 ISBN 13 : 9780735401525

Editeur : American Institute of Physics, 2003

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This book/CD-ROM package presents papers from a March 2003 conference on progress in semiconductor technology, detailing major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics. Scientists and engineers conc

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�diteur: American Institute of Physics
Date d'�dition: 2003
Langue: anglais
ISBN 10: 0735401527
ISBN 13: 9780735401525
Reliure: Reli�
Nombre de pages: 836
�diteur: Seiler David G., Diebold Alain C., Shaffner Thomas J., McDonald Robert, Zollner Stefan, Khosla Rajinder P., Secula Eric M.
Coordonn�es du fabricant: non disponible
Personne responsable: non disponible

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Characterization and Metrology for ULSI Technology: 2003: 2003 International Conference on Characterization and Metrology for ULSI Technology (AIP Conference Proceedings, 683)

Edit� par American Institute of Physics, 2003

ISBN 10 : 0735401527 ISBN 13 : 9780735401525

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Vendeur : Goodwill of Silicon Valley, SAN JOSE, CA, Etats-Unis

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Etat : acceptable. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear such as cover tears discoloration, staining, marks, scuffs, etc. All pages intact. N� de r�f. du vendeur GWSVV.0735401527.A

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Characterization and Metrology for ULSI Technology: 2003: 2003 International Conference on Characterization and Metrology for ULSI Technology (AIP Conference Proceedings, 683)

Alain C. Diebold Thomas J. Shaffner David G. Seiler

Edit� par American Institute of Physics, 2003

ISBN 10 : 0735401527 ISBN 13 : 9780735401525

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Etat : Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions. N� de r�f. du vendeur Z1-V-010-01500

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Characterization and Metrology for ULSI Technology: 2003: 2003 International Conference on Characterization and Metrology for ULSI Technology (AIP Conference Proceedings)

Edit� par American Institute of Physics, 2003

ISBN 10 : 0735401527 ISBN 13 : 9780735401525

Ancien ou d'occasion Couverture rigide

Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni

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Hardcover. Etat : Acceptable. Acceptable. Dust Jacket NOT present. CD WILL BE MISSING. SHIPS FROM MULTIPLE LOCATIONS. book. N� de r�f. du vendeur ERICA82907354015273

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