X-Ray Optics and Microanalysis - Couverture rigide

Couverture rigide

ISBN 10 : 0735407649 ISBN 13 : 9780735407640

Editeur : American Institute of Physics, 2010

Synopsis

"ICXOM Series" is a platform dedicated for reporting progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams (with an ICXOM20 emphasis on synchrotron sources), electrons or other energetic particles, including application examples, as well as methodological and instrumental developments.

Détails de l'édition

• Éditeur: American Institute of Physics
• Date d'édition: 2010
• Langue: anglais
• ISBN 10: 0735407649
• ISBN 13: 9780735407640
• Reliure: Relié
• Nombre de pages: 228
• Éditeur: Denecke Melissa A., Walker Clive T.
• Coordonnées du fabricant: Springer-Verlag GmbH; customerservice@springernature.com; ; Tiergartenstraße 17; Heidelberg; Baden-Württemberg; 69121; Allemagne