Articles liés à Characterisation of Radiation-Damage by Transmission...

Characterisation of Radiation-Damage by Transmission Electron Microscopy - Couverture rigide

Livre 3 sur 5: Series in Microscopy in Materials Science

Jenkins, Margie Little; Kirk, M. A.

 
9780750307482: Characterisation of Radiation-Damage by Transmission Electron Microscopy
Couverture rigide
ISBN 10 : 075030748X ISBN 13 : 9780750307482
Editeur : Institute of Physics Publishing, 2000

Synopsis

Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical techniques. Techniques are illustrated with examples, providing a solid overview of the contribution of TEM to radiation damage mechanisms. The book is most useful to researchers in, or entering into, the field of defect analysis in materials.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

À propos de l'auteur

M.L Jenkins, M.A Kirk

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Institute of Physics Publishing
Date d'édition
2000
Langue
anglais
ISBN 10 
075030748X
ISBN 13 
9780750307482
Reliure
Relié
Nombre de pages
234
Coordonnées du fabricant
non disponible
Personne responsable
non disponible