Principles of Semiconductor Testing: Test and Measurement Series - Couverture rigide

Afshar, Amir

Couverture rigide

ISBN 10 : 0750694726 ISBN 13 : 9780750694728

Editeur : Newnes (an imprint of Butterworth-Heinemann Ltd ), 1996

Synopsis

Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

A propos du livre

Présentation de l'éditeur

Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.

This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

• Introduces a novel component-testing philosophy for semiconductor test, product and design engineers
• Best new source of information for experienced semiconductor engineers as well as entry-level personnel
• Eight chapters about semiconductor testing

Présentation de l'éditeur

This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.

This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

Introduces a novel component-testing philosophy for semiconductor test, product and design engineers.
Best new source of information for experienced semiconductor engineers as well as entry-level personnel.
Eight chapters about semiconductor testing.

Détails de l'édition

• Éditeur: Newnes (an imprint of Butterworth-Heinemann Ltd )
• Date d'édition: 1996
• Langue: anglais
• ISBN 10: 0750694726
• ISBN 13: 9780750694728
• Reliure: Relié
• Nombre de pages: 350
• Coordonnées du fabricant: NEWNES; https://www.elsevier.com; ; Via Spadolini, 7; Milano; 20141; Italie