Defect and Fault Tolerance in Vlsi Systems (Dft 2000): 2000 IEEE International Symposium - Couverture souple

IEEE Computer Society

 
9780769507194: Defect and Fault Tolerance in Vlsi Systems (Dft 2000): 2000 IEEE International Symposium

Synopsis

This work constitutes the proceedings of the 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2000). Subjects addressed include: yield analysis and modelling; wafer scale/large area systems; fault-tolerant systems; tesitng strategies; and more.

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