Articles liés à Forces in Scanning Probe Methods
Synopsis
This volume contains the proceedin, r. of the NATO Advanced Study Institute on "Forces in Scanning Probe Methods which was CG-sponsered and organized by the "Forum fUr N anowissenschaften". The conference was held in Schluchsee in the south- em Black Forest (Germany) from March 7-18, 1994. 30 invited lecturers giving tuto- rial talks of historical and recent research activities and about 100 contributed, oral and poster presentations from 130 people participating, created a very active and lestimulating, lively atmosphere. The inventions of scanning tunneling microscopy, atomic force microscopy and near field optical microsocopy opened a new field of research, called scanning probe meth- ods (SPM). During the last decade, the quality of image acquisition made tremendous progress due to advanced data acquisition systems, low noise electronics and suitable mechan- ical and micromechanical constructions. However, a lot of fundamental, unsolved questions about the interaction between probing tip and sample remain. This vol- ume contains 60 contributions dedicated to these problems. Most of the articles are review articles presenting. condensed and relevant information in a way suitable for both students and specialists. Topics that are covered are instrumental aspects, de- signs of force microscopes in various environments, such as ambient pressure, low temperature, ultrahip vacuum and liquids. An important part of the workshop was dedicated to theory, Including all initio calculations and molecular dynamics simula- tions. Mechanical properties, such as adhesion, friction and wear, on the micrometer and nanometer scale were also treated intensively.
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Forces in Scanning Probe Methods: 286 (NATO Science Series E:, 286)
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Springer, 1995
ISBN 10 : 079233406X
ISBN 13 : 9780792334064
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hardcover. Etat : Very Good. Forces in Scanning Probe Methods: 286 (NATO Science Series E:, 286) This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clearly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. . N° de réf. du vendeur 7719-9780792334064
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Forces in Scanning Probe Methods. NATO ASI Series/ Series E: Applied Sciences - Vol. 286
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Kluwer Academic Publishers, 1995
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ISBN 13 : 9780792334064
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Hardcover/Pappeinband. Etat : Gut. xiii, 644 Seiten Sprache: Englisch Gewicht in Gramm: 1500. N° de réf. du vendeur 138198
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Forces in Scanning Probe Methods (NATO Science Series E:, 286)
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Forces in Scanning Probe Methods
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Springer Netherlands, 1995
ISBN 10 : 079233406X
ISBN 13 : 9780792334064
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Gebunden. Etat : New. Proceedings of the NATO Advanced Study Institute, Schluchsee, Germany, March 7--18, 1994 Preface. Introduction to Scanning Probe Methods. Instrumentation. Theory. Metallic Adhesion. Photons. Friction. Nano and Micromechanics. Magnetic Storage and. N° de réf. du vendeur 458438673
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Forces in Scanning Probe Methods
Edité par
Springer Mär 1995, 1995
ISBN 10 : 079233406X
ISBN 13 : 9780792334064
Neuf
Couverture rigide
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
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Buch. Etat : Neu. Neuware - This volume contains the proceedin,r. of the NATO Advanced Study Institute on 'Forces in Scanning Probe Methods which was CG-sponsered and organized by the 'Forum fUr N anowissenschaften'. The conference was held in Schluchsee in the south em Black Forest (Germany) from March 7-18, 1994. 30 invited lecturers giving tuto rial talks of historical and recent research activities and about 100 contributed, oral and poster presentations from 130 people participating, created a very active and lestimulating, lively atmosphere. The inventions of scanning tunneling microscopy, atomic force microscopy and near field optical microsocopy opened a new field of research, called scanning probe meth ods (SPM). During the last decade, the quality of image acquisition made tremendous progress due to advanced data acquisition systems, low noise electronics and suitable mechan ical and micromechanical constructions. However, a lot of fundamental, unsolved questions about the interaction between probing tip and sample remain. This vol ume contains 60 contributions dedicated to these problems. Most of the articles are review articles presenting. condensed and relevant information in a way suitable for both students and specialists. Topics that are covered are instrumental aspects, de signs of force microscopes in various environments, such as ambient pressure, low temperature, ultrahip vacuum and liquids. An important part of the workshop was dedicated to theory, Including all initio calculations and molecular dynamics simula tions. Mechanical properties, such as adhesion, friction and wear, on the micrometer and nanometer scale were also treated intensively. N° de réf. du vendeur 9780792334064
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