Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale - Couverture rigide

 
9780792344896: Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale
Couverture rigide
ISBN 10 : 0792344898 ISBN 13 : 9780792344896
Editeur : Kluwer Academic Publishers, 1997

Synopsis

An assessment of the recent achievements and relative strengths of two developing techniques for characterising surfaces at the nanometer scale: (i) local probe methods, including scanning tunnelling microscopy and its derivatives; and (ii) nanoscale photoemission and absorption spectroscopy for chemical analysis.
The keynote lectures were delivered by some of the world's best scientists in the field and some of the topics covered include: (1) The possible application of STM in atomically resolved chemical analysis. (2) The principles of scanning force/friction and scanning near-field optical microscopes. (3) The scanning photoemission electron microscopes built at ELETTRA and SRRC, with a description of synchrotron radiation microscopy. (4) Recent progress in the development of spatially-resolved photoelectron microscopy, especially the use of zone plate photon optics. (5) The present status of non-scanning photoemission microscopy with slow electrons. (6) the BESSY 2 project for a non-scanning photoelectron microscope with electron optics. (7) Spatially-resolved in situ reaction studies of chemical waves and oscillatory phenomena with the UV photoemission microscope.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

An assessment of the recent achievements and relative strengths of two developing techniques for characterising surfaces at the nanometer scale: (i) local probe methods, including scanning tunnelling microscopy and its derivatives; and (ii) nanoscale photoemission and absorption spectroscopy for chemical analysis.
The keynote lectures were delivered by some of the world's best scientists in the field and some of the topics covered include: (1) The possible application of Stm in atomically resolved chemical analysis. (2) The principles of scanning force/friction and scanning near-field optical microscopes. (3) The scanning photoemission electron microscopes built at Elettra and Srrc, with a description of synchrotron radiation microscopy. (4) Recent progress in the development of spatially-resolved photoelectron microscopy, especially the use of zone plate photon optics. (5) The present status of non-scanning photoemission microscopy with slow electrons. (6) the Bessy 2 project for a non-scanning photoelectron microscope with electron optics. (7) Spatially-resolved in situ reaction studies of chemical waves and oscillatory phenomena with the Uv photoemission microscope.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Kluwer Academic Publishers
Date d'édition
1997
Langue
anglais
ISBN 10 
0792344898
ISBN 13 
9780792344896
Reliure
Relié
Nombre de pages
142
Éditeur
Rosei R.
Coordonnées du fabricant
ProductSafety@springernature.com
ProductSafety@springernature.com

Poststr. 9
Darmstadt
64293
Allemagne

Autres éditions populaires du même titre

9789401064149: Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale: (Closed))

Edition présentée

ISBN 10 :  9401064148 ISBN 13 :  9789401064149
Editeur : Springer, 2012
Couverture souple