Defect Oriented Testing for Cmos Analog and Digital Circuits - Couverture rigide

Sachdev, Manoj

Couverture rigide

ISBN 10 : 0792380835 ISBN 13 : 9780792380832

Editeur : Kluwer Academic Publishers, 1997

Synopsis

Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality, and many factors have contributed to their industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market-place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex, and demand components of the highest possible quality. Testing in general, and defect-oriented testing in particular, help in realizing these objectives. Providing a detailed overview of the subject, this book is intended for design and test professionals as well as researchers and students working in the field.

Détails de l'édition

• Éditeur: Kluwer Academic Publishers
• Date d'édition: 1997
• Langue: anglais
• ISBN 10: 0792380835
• ISBN 13: 9780792380832
• Reliure: Relié
• Nombre de pages: 324
• Coordonnées du fabricant: non disponible
• Personne responsable: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Allemagne