Articles liés à Simultaneous Switching Noise of Cmos Devices and Systems
Synopsis
This monograph presents our recent research on Simultaneous Switching Noise (SSN) and related issues for CMOS based systems. Although some SSN related work was previously reported in the literature, it were mainly for Emitter Coupled Logic (ECL) gates using Bipolar Junction Transistors (BJTs). This present work covers in-depth analysis on estimating SSN and its impact for CMOS based devices and systems. At present semiconductor industries are moving towards scaled CMOS devices and reduced supply voltage. SSN together with coupled noise may limit the packing density, and thereby the frequency of operation of packaged systems. Our goal is to provide efficient and yet reliable methodologies and algorithms to estimate the overall noise containment in single chip and multi-chip package assemblies. We hope that the techniques and results described in this book will be useful as guides for design, package, and system engineers and academia working in this area. Through this monograph, we hope that we have shown the necessity of interactions that are essential between chip design, system design and package design engineers to design and manufacture optimal packaged systems. Work reported in this monograph was partially supported by the grant from Semiconductor Research Corporation (SRC Contract No. 92-MP-086).
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Acheter neuf
Afficher cet article
EUR 96,17
EUR 6,81 expédition vers Etats-Unis
Destinations, frais et délaisAutres éditions populaires du même titre
Résultats de recherche pour Simultaneous Switching Noise of Cmos Devices and Systems
Image d'archives
Simultaneous Switching Noise of Cmos Devices and Systems (the Springer International Series in Engineering and Computer Science)
Edité par
Kluwer Academic Pub, 1994
ISBN 10 : 0792394003
ISBN 13 : 9780792394006
Ancien ou d'occasion
Couverture rigide
Vendeur : Textsellers, Hampton, NH, Etats-Unis
Évaluation du vendeur 3 sur 5 étoiles
Hardcover. Etat : Very Good. No Jacket. Hardcover, 204 pp. Name on ffep, light cover wear, one corner fold, else text clean. Book. N° de réf. du vendeur 021578
Quantité disponible : 1 disponible(s)
Image d'archives
Simultaneous Switching Noise of Cmos Devices and Systems
Edité par
Kluwer Academic Pub, Secaucus, New Jersey, U.S.A., 1994
ISBN 10 : 0792394003
ISBN 13 : 9780792394006
Ancien ou d'occasion
Couverture rigide
Vendeur : Book Grove, RMABA, Glenwood Springs, CO, Etats-Unis
Évaluation du vendeur 4 sur 5 étoiles
Hardcover. Etat : Near Fine. Very clean, tight and bright. N° de réf. du vendeur 012303
Quantité disponible : 1 disponible(s)
Image d'archives
Simultaneous Switching Noise of CMOS Devices and Systems
Edité par
Kluwer, BOSTON, 1994
ISBN 10 : 0792394003
ISBN 13 : 9780792394006
Ancien ou d'occasion
Couverture rigide
Edition originale
Vendeur : Webbooks, Wigtown, Wigtown, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
Hardcover. Etat : Very Good. No Jacket. First Edition. Ex library with the usual blemishes. OX2745. N° de réf. du vendeur OX2745
Quantité disponible : 1 disponible(s)
Image d'archives
Simultaneous Switching Noise of CMOS Devices and Systems (The Springer International Series in Engineering and Computer Science, 249)
Vendeur : Best Price, Torrance, CA, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. SUPER FAST SHIPPING. N° de réf. du vendeur 9780792394006
Quantité disponible : 1 disponible(s)
Image fournie par le vendeur
Simultaneous Switching Noise of Cmos Devices and Systems
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. N° de réf. du vendeur 2361594-n
Quantité disponible : Plus de 20 disponibles
Image d'archives
Simultaneous Switching Noise of CMOS Devices and Systems (The Springer International Series in Engineering and Computer Science, 249)
Vendeur : Lucky's Textbooks, Dallas, TX, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. N° de réf. du vendeur ABLIING23Feb2416190185881
Quantité disponible : Plus de 20 disponibles
Image fournie par le vendeur
Simultaneous Switching Noise of Cmos Devices and Systems
Edité par
Springer, 1993
ISBN 10 : 0792394003
ISBN 13 : 9780792394006
Ancien ou d'occasion
Couverture rigide
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Etat : As New. Unread book in perfect condition. N° de réf. du vendeur 2361594
Quantité disponible : Plus de 20 disponibles
Image d'archives
Simultaneous Switching Noise of CMOS Devices and Systems (The Springer International Series in Engineering and Computer Science, 249)
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. In. N° de réf. du vendeur ria9780792394006_new
Quantité disponible : Plus de 20 disponibles
Image fournie par le vendeur
Simultaneous Switching Noise of Cmos Devices and Systems
Vendeur : GreatBookPricesUK, Woodford Green, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. N° de réf. du vendeur 2361594-n
Quantité disponible : Plus de 20 disponibles
Image fournie par le vendeur
Simultaneous Switching Noise of CMOS Devices and Systems
Edité par
Springer US Nov 1993, 1993
ISBN 10 : 0792394003
ISBN 13 : 9780792394006
Neuf
Couverture rigide
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This monograph presents our recent research on Simultaneous Switching Noise (SSN) and related issues for CMOS based systems. Although some SSN related work was previously reported in the literature, it were mainly for Emitter Coupled Logic (ECL) gates using Bipolar Junction Transistors (BJTs). This present work covers in-depth analysis on estimating SSN and its impact for CMOS based devices and systems. At present semiconductor industries are moving towards scaled CMOS devices and reduced supply voltage. SSN together with coupled noise may limit the packing density, and thereby the frequency of operation of packaged systems. Our goal is to provide efficient and yet reliable methodologies and algorithms to estimate the overall noise containment in single chip and multi-chip package assemblies. We hope that the techniques and results described in this book will be useful as guides for design, package, and system engineers and academia working in this area. Through this monograph, we hope that we have shown the necessity of interactions that are essential between chip design, system design and package design engineers to design and manufacture optimal packaged systems. Work reported in this monograph was partially supported by the grant from Semiconductor Research Corporation (SRC Contract No. 92-MP-086). 230 pp. Englisch. N° de réf. du vendeur 9780792394006
Quantité disponible : 2 disponible(s)