Intersections in Basic and Applied Memory Research - Couverture rigide

 
9780805819731: Intersections in Basic and Applied Memory Research

Synopsis

In recent years there has been increasing interaction between basic and applied memory researchers, ranging from heated debates to highly productive collaborations. This collection of papers -- based on presentations at the Third Practical Aspects of Memory conference -- reviews the progress, as well as obstacles to progress, in the ongoing collaboration between basic and applied memory researchers.

This volume represents the state of the art in memory research domains that straddle the basic-applied divide. The text is organized around three themes, including theoretical and metatheoretical issues concerning the interaction of basic and applied memory research, laboratory investigation of real world memory problems, and solutions of everyday problems using theoretical concepts derived from basic memory research. The first section illustrates why collaboration between basic and applied memory researchers should be beneficial and provides guidelines for avoiding some of the pitfalls. The second and third sections present some of the most significant, contemporary findings by researchers whose work is basic-yet-applicable or applied-yet-theoretically-based.

Students and professional memory researchers will find the substantive results to be provocative and theoretically engaging, making the information presented in this volume invaluable. These examples of successful application will be of substantial, pragmatic value and researchers are certain to be grappling with these issues for years to come.

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À propos de l?auteur

David G. Payne, Frederick G. Conrad

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Autres éditions populaires du même titre

9781138973138: Intersections in Basic and Applied Memory Research

Edition présentée

ISBN 10 :  1138973130 ISBN 13 :  9781138973138
Editeur : Routledge, 2020
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