This volume is a collection of invited chapters covering recent advances in accelerated life testing and degradation models. The book covers a wide range of applications to areas such as reliability, quality control, the health sciences, economics and finance. It is an excellent reference for researchers and practitioners in applied probability and statistics, industrial statistics, the health sciences, quality control, economics, and finance.
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Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This volume is a collection of invited chapters covering recent advances in accelerated life testing and degradation models. The book covers a wide range of applications to areas such as reliability, quality control, the health sciences, economics and finance. It is an excellent reference for researchers and practitioners in applied probability and statistics, industrial statistics, the health sciences, quality control, economics, and finance. 416 pp. Englisch. N° de réf. du vendeur 9780817649234
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Covers a wide range of applications to areas such as reliability, quality control, the health sciences, economics, and financeFor a broad audience of researchers and practitioners in applied probability and statistics, industrial statistics, the h. N° de réf. du vendeur 5975926
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Buch. Etat : Neu. Neuware -William Q. Meeker has made pioneering and phenomenal contributions to the general areaofreliabilityand,inparticular,tothetopicsofdegradationandacceleratedtesting. Hisresearchpublicationsandthenumerouscitationshehasreceivedoverthepa stthree decades provide an ample testimony to this fact. Statistical methods have become critical in analyzing reliability and survival data. Highly reliable products have necessitated the development of accelerated testing and degradation models and their analyses. This volume has been put together in order to (i) review some of the recent advances on accelerated testing and degradation, (ii) highlight some new results and discuss their applications, and (iii) suggest possible directions for future research in these topics. With these speci c goals in mind, many authors were invited to write a chapter for this volume. These authors are not only experts in lifetime data analysis, but also form a representative group from former students, colleagues, and other close professional associates of William Meeker. All contributions have been peer reviewed and organized into 26 chapters. For the convenience of readers, the volume has been divided into the following six parts: ¿ Review, Tutorials, and Perspective ¿ Shock Models ¿ Degradation Models ¿ Reliability Estimation and ALT ¿ Survival Function Estimation ¿ Competing Risk and Chaotic Systems Itneedstobeemphasizedherethatthisvolumeisnotaproceedings,butacarefully anddeliberatelyplannedvolumecomprisingchaptersconsistentwiththeeditorialgoals and purposes mentioned above. Our thanks go to all the authors who have contributed to this volume. Thanks are also due to Mrs. Debbie Iscoe for the excellent typesetting of the entire volume.SpecialthanksgotoMs.ReginaGorenshteynandMr.TomGrasso(Editor,Bi rkh¿ auser, Boston) for their interest and support for this project.Springer Basel AG in Springer Science + Business Media, Heidelberger Platz 3, 14197 Berlin 456 pp. Englisch. N° de réf. du vendeur 9780817649234
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Vendeur : Buchpark, Trebbin, Allemagne
Etat : Sehr gut. Zustand: Sehr gut | Seiten: 416 | Sprache: Englisch | Produktart: Bücher | William Q. Meeker has made pioneering and phenomenal contributions to the general areaofreliabilityand,inparticular,tothetopicsofdegradationandacceleratedtesting. Hisresearchpublicationsandthenumerouscitationshehasreceivedove rthepastthree decades provide an ample testimony to this fact. Statistical methods have become critical in analyzing reliability and survival data. Highly reliable products have necessitated the development of accelerated testing and degradation models and their analyses. This volume has been put together in order to (i) review some of the recent advances on accelerated testing and degradation, (ii) highlight some new results and discuss their applications, and (iii) suggest possible directions for future research in these topics. With these speci?c goals in mind, many authors were invited to write a chapter for this volume. These authors are not only experts in lifetime data analysis, but also form a representative group from former students, colleagues, and other close professional associates of William Meeker. All contributions have been peer reviewed and organized into 26 chapters. For the convenience of readers, the volume has been divided into the following six parts: ¿ Review, Tutorials, and Perspective ¿ Shock Models ¿ Degradation Models ¿ Reliability Estimation and ALT ¿ Survival Function Estimation ¿ Competing Risk and Chaotic Systems Itneedstobeemphasizedherethatthisvolumeisnotaproceedings,butacarefully anddeliberatelyplannedvolumecomprisingchaptersconsistentwiththeeditorialgoals and purposes mentioned above. Our thanks go to all the authors who have contributed to this volume. Thanks are also due to Mrs. Debbie Iscoe for the excellent typesetting of the entire volume.SpecialthanksgotoMs.ReginaGorenshteynandMr.TomGrasso(Edi tor,Birkh¿ auser, Boston) for their interest and support for this project. N° de réf. du vendeur 5499180/2
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