Papers from the 1997 IEEE International Symposium on Defect and Fault Tolerant in VLSI Systems.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
EUR 3,24 expédition vers Etats-Unis
Destinations, frais et délaisVendeur : HPB-Red, Dallas, TX, Etats-Unis
paperback. Etat : Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! N° de réf. du vendeur S_328809026
Quantité disponible : 1 disponible(s)
Vendeur : Alien Bindings, BALTIMORE, MD, Etats-Unis
Softcover. Etat : Very Good. No Jacket. First Edition. Ex research library book. The covers look great. The binding is tight. The interior pages are clean and unmarked. Electronic delivery tracking will be issued free of charge. N° de réf. du vendeur 09054
Quantité disponible : 1 disponible(s)