Digital Shearography: Theory and Application of Digital Speckle Pattern Shearing Interferometry - Couverture rigide

Steinchen, Wolfgang

Couverture rigide

ISBN 10 : 0819441104 ISBN 13 : 9780819441102

Editeur : SPIE Press, 2003

Synopsis

The ever-increasing requirements of product quality and reliability demand more efficient measuring and testing methods that must be online, non-destructive, whole field, and without contact. Developed in the 1990s, shearography - also called speckle pattern shearing interferometry (SPSI) - is a coherent-optical measuring and testing method, similar to holographic interferometry. Unlike holography, however, shearography measures the gradient of the deformation rather than the deformation itself. Consequently, shearography can measure the strain information directly, increasing its importance as an industrial measuring tool. This work describes the development of second-generation digital shearography, which is effective in non-destructive testing (NDT), strain measurement, and vibration analysis due to its relative insensitivity to environmental disturbances.

Détails de l'édition

• Éditeur: SPIE Press
• Date d'édition: 2003
• Langue: anglais
• ISBN 10: 0819441104
• ISBN 13: 9780819441102
• Reliure: Relié
• Nombre de pages: 475
• Coordonnées du fabricant: non disponible
• Personne responsable: non disponible