Speckle Metrology - Couverture rigide

Couverture rigide

ISBN 10 : 0824789326 ISBN 13 : 9780824789329

Editeur : CRC Press Inc, 1993

Synopsis

This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.

A propos du livre

À propos de l'auteur

R. S Sirohi (Author)

Détails de l'édition

• Éditeur: CRC Press Inc
• Date d'édition: 1993
• Langue: anglais
• ISBN 10: 0824789326
• ISBN 13: 9780824789329
• Reliure: Relié
• Nombre de pages: 572
• Éditeur: Sirohi Rajpal S.
• Coordonnées du fabricant: non disponible
• Personne responsable: GPSR Kontakt; gpsr@libri.de; ; Friedensallee 273; Hamburg; 22763; Allemagne