Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power consumption and recent developments in low-power memories. Reflecting the rapid development and importance of systems-on-a-chip (SOCs), an entire chapter is devoted to application-specific integrated circuits (ASICs). Design-related topics include microprocessor architectures, layout methods, design verification, testability concepts, and various CAD tools.
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Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Wai-Kai Chen
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Etat : New. Timing, memory, power dissipation, testing, and testability are crucial elements of VLSI circuit design. This title treats stacked gate, embedded, and flash memory, including their power consumption and developments in low-power memories. It provides a chapter to deal with the topic of application-specific integrated circuits (ASICs). Editor(s): Chen, Wai-Kai. Series: Principles and Applications in Engineering. Num Pages: 384 pages, 277 black & white illustrations, 33 black & white tables. BIC Classification: TJFC; TJFD1. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 254 x 178 x 26. Weight in Grams: 839. . 2003. Hardback. . . . . N° de réf. du vendeur V9780849317378
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